Verified
Total reflection x-ray fluorescence spectrometers:
S2 PICOFOX
Fast trace element analysis with TXRF
Bruker Nano GmbH
Simultaneous multi-element trace analysis, including halogenides
Analysis of smallest sample amounts in the nanogram or microgram range
Simple quantification using an internal standard without daily calibration
Quantitative and semiquantitative element analysis of liquids, suspensions, solids and contamination
The S2 PICOFOX is a transportable TXRF spectrometer for ultra-trace element analysis. Due to its complete independence of any gas or cooling medium, the analyzer can be used not only in the laboratory but also for on-site analyses in the field. It's working principle is based on total reflection X-ray fluorescence (TXRF) analysis. The use of monochromatic radiation and total reflection optics leads to the following benefits of the S2 PICOFOX:
- Reduced absorption and scattering effects in the sample matrix enable an easy quantification by internal standards.
- Short detector to sample distance leads to an enhanced fluorescence yield.
- Due to the reduced background, detection limits are several orders of magnitude lower.
- Extremely low sample amounts of liquids and powders can be precisely quantified.
Specifications
1
The S2 PICOFOX is a transportable TXRF spectrometer for ultra-trace element analysis.
2
The S2 PICOFOX is a transportable TXRF spectrometer also for in-field use.
Product classification S2 PICOFOX
Applications
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Total reflection x-ray fluorescence spectrometers: S2 PICOFOX
Fast trace element analysis with TXRF
